This project explores component footprint design and associated circuit board assembly processes for the latest generation of fine pitch QFN devices. The project will use both post assembly yield assessments and longer term reliability testing (using accelerated thermal cycling techniques) to evaluate the impact of using different design and process parameters.
If you are interested in this project and would like to subscribe to the project mailing list, please click here (members only) or email the project facilitator, Brian Smith - brians@hdpug.org.